Abstract: A kind of new deflection technique has been developed for measuring the growth stress of thermally growing oxide scales during high temperature oxidation of alloys. The average growth stresses in oxide scales such as Al2O3, NiO and Cr2O3 formed on the surface of the superalloys can be investigated by this technique. Unlike the conventional deflection method, the novel method does not need to apply a coating for preventing one main face of thin strip specimen from oxidizing and can be used under the condition of longer time and higher temperature.

Key words: Oxide film, Growth stress, Deflection method