Spatially Resolved Analytical Electron Microscopy at Grain Boundaries of a-Al2O3

J Mater Sci Technol ›› 2002, Vol. 18 ›› Issue (02): 189-190.

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Spatially Resolved Analytical Electron Microscopy at Grain Boundaries of a-Al2O3

S.Nufer, A.G.Marinopoulos, C.Elsässer, W.Kurtz, M.Rűhle

Max-Planck-Institut fűr Metallforschung, Seestr. 92, D-70174 Stuttgart, Germany

Received:1900-01-01 Revised:1900-01-01 Online:2002-03-28 Published:2009-10-10
Contact: S.Nufer

Abstract

Abstract: In this work the electronic structure and the impurity excess of the basal and rhombohedral twin grain boundaries are investigated, using electron energy loss spectroscopy (EELS) and energy dispersive X-ray spectroscopy (EDXS). The measurability of electronic structures of the twin grain boundaries are discussed by comparing theoretical density of states (DOS) from bulk material with interfacial DOS, obtained from local density functional theory (LDFT) calculations.

Key words: Grain boundaries, Alumina (a-Al2O3), Local density function theory (LDFT)...

S.Nufer, A.G.Marinopoulos, C.Elsä, sser, W.Kurtz, M.R&#, hle. Spatially Resolved Analytical Electron Microscopy at Grain Boundaries of a-Al2O3[J]. J Mater Sci Technol, 2002, 18(02): 189-190.

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Spatially Resolved Analytical Electron Microscopy at Grain Boundaries of a-Al2O3

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