J Mater Sci Technol ›› 2002, Vol. 18 ›› Issue (01): 31-33.

• Research Articles • Previous Articles     Next Articles

Nanostructure Study of TiO2 Films Prepared by Dip Coating Process

S.M.Attia, Jue WANG, Guangming WU, Jun SHEN, Jianhua MA   

  1. Pohl Institute of Solid State Physics, Tongji University, Shanghai 200092, China
  • Received:1900-01-01 Revised:1900-01-01 Online:2002-01-28 Published:2009-10-10
  • Contact: Guangming WU

Abstract: The microstructure properties of the sol-gel derived TiO2 films were studied by the atomic force microscopy (AFM). The films were prepared by dip coating process. The optical properties of the films were explained on the basis of the microstructure of the films.

Key words: Atomic force microscopy, TiO2 thin film, Sol-gel process