J. Mater. Sci. Technol. ›› 2023, Vol. 134: 223-233.DOI: 10.1016/j.jmst.2022.06.028
• Research Article • Previous Articles Next Articles
X.F. Xua,b, X.Y. Lia,*(), B. Zhanga
Received:
2022-04-24
Revised:
2022-06-13
Accepted:
2022-06-16
Published:
2023-01-20
Online:
2023-01-10
Contact:
X.Y. Li
About author:
* E-mail address: xyli@imr.ac.cn (X.Y. Li).X.F. Xu, X.Y. Li, B. Zhang. Stabilizing nanograined Fe-Cr alloy by Si-assisted grain boundary segregation[J]. J. Mater. Sci. Technol., 2023, 134: 223-233.
Secondary solute | Thermodynamic parameters (kJ/mol) | |||
---|---|---|---|---|
i | -33 | -74 | 47 | 2 |
V | -8 | -29 | 27 | -1 |
Mn | 8 | 1 | 13 | -6 |
Co | -18 | -2 | -10 | -4 |
Ni | -27 | -6 | -15 | -6.8 |
Zr | -58 | -118 | 66 | 8 |
Nb | -32 | -70 | 44 | 9 |
Mo | 2 | -9 | 17 | -8.7 |
W | 4 | 0 | 10 | 4 |
Al | -87 | -91 | 10 | -3.3 |
Cu | 49 | 50 | 5 | 2 |
B | -146 | -127 | -13 | -58.5 |
Si | -134 | -122 | -6 | -7 |
C | -233 | -193 | -34 | -52 |
N | -439 | -361 | -72 | -52 |
Cr | - | -6 | - | -6 |
Table 1. Thermodynamics parameters of common additive elements in Fe alloys [1,34].
Secondary solute | Thermodynamic parameters (kJ/mol) | |||
---|---|---|---|---|
i | -33 | -74 | 47 | 2 |
V | -8 | -29 | 27 | -1 |
Mn | 8 | 1 | 13 | -6 |
Co | -18 | -2 | -10 | -4 |
Ni | -27 | -6 | -15 | -6.8 |
Zr | -58 | -118 | 66 | 8 |
Nb | -32 | -70 | 44 | 9 |
Mo | 2 | -9 | 17 | -8.7 |
W | 4 | 0 | 10 | 4 |
Al | -87 | -91 | 10 | -3.3 |
Cu | 49 | 50 | 5 | 2 |
B | -146 | -127 | -13 | -58.5 |
Si | -134 | -122 | -6 | -7 |
C | -233 | -193 | -34 | -52 |
N | -439 | -361 | -72 | -52 |
Cr | - | -6 | - | -6 |
Fig. 1. Ternary interaction parameter $\alpha _{\text{Cr}-\text{X}}^{\text{G}{{\text{B}}^{\prime }}}$ of common addition elements in Fe alloys vs their corresponding (a) standard GB segregation Gibbs energy $\text{ }\!\!\Delta\!\!\text{ }G_{\text{X}}^{0,\text{seg}}$, (b) binary Fe-X interaction parameters ${{\alpha }_{\text{Fe}-\text{X}}}$.
Fig. 2. Microstructure of Fe-8Cr and Fe-8Cr-1Si in the NG layers. Bright-field TEM images of (a) as deformed NG Fe-8Cr and (b) annealed NG Fe-8Cr at 743 K, (c) structure size statistical distribution of as deformed and annealed NG Fe-8Cr. Bright-field TEM images of (d) as deformed NG Fe-8Cr-1Si and (e) annealed NG Fe-8Cr-1Si at 743 K, (f) structure size statistical distribution of as deformed and annealed NG Fe-8Cr-1Si.
Fig. 3. (a) HAADF-STEM image and EDS mappings of (b) Fe and (c) Cr for as deformed NG Fe-8Cr, (d) line scan along the dash line as marked in (a). (e) HAADF-STEM images and EDS mappings of (f) Fe and (g) Cr for the annealed NG Fe-8Cr, (h) line scan along the dash line as marked in (e).
Fig. 4. (a) HAADF-STEM image and EDS mappings of (b) Fe, (c) Cr, and (d) Si for as deformed NG Fe-8Cr-1Si, (e) line scan of Fe, Cr and Si along the dash line as marked in (a). (f) HAADF-STEM image and EDS mappings of (g) Fe, (h) Cr and (i) Si for the annealed NG Fe-8Cr-1Si, (j) line scan of Fe, Cr and Si along the dash line as marked in (f).
Fig. 5. Characterizations of NG Fe-8Cr-1Si annealed at 743 K from the precession electron diffraction analysis: (a) a typical IPF, (b) KAM image, and (c) misorientation angle distribution.
Fig. 6. (a) HAADF-STEM image and EDS mappings of (b) Cr and (c) Si for the annealed NG Fe-6Cr-1Si, (d) line scan of Fe, Cr and Si along the dash line as marked in (a). (e) HAADF-STEM image and EDS mappings of (f) Cr for the annealed NG Fe-6Cr, (g) line scan of Fe and Cr along the dash line as marked in (e).
Fig. 7. Cr concentration of GB variations as a function of grain size for NG Fe-8Cr-1Si alloy annealed at 743 K and Cr concentration of GB for NG Fe-6Cr and NG Fe-6Cr-1Si annealed at 743 K with grain size below 50 nm and around 80 nm.
Fig. 9. (a) HAADF-STEM image of annealed NG Fe-8Cr-1Si with corresponding elemental mappings of (b) Fe, (c) Cr and (d) Si. (e) HAADF-STEM image of annealed NG Fe-8Cr with corresponding elemental mappings of (f) Fe and (g) Cr. (h) Line scan of Fe and Cr crossing a precipitate along the white dash line shown in (e).
Fig. 10. (a) HRTEM image of a precipitate indicated in the yellow dash box shown in Fig. 9(e). (b) Enlarged HRTEM image and (c) FFT image of area inside the yellow dash box as marked in (a).
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