Fig. 1. Representative cross-sectional TEM and energy dispersive spectrometer (EDS) images for the as-deposited A/ANLs before indentation test. (a) TEM image in a low magnification, inset with the corresponding SAED pattern. (b) High resolution TEM image for the interfacial structure indicated by the rectangle in (a). (c) The selected region for EDS test, with (c-1) to (c-4) representing the distribution of Zr, Cu, Ni, and Al, respectively.

Fig. 2. Representative cross-sectional TEM and EDS images for the irradiated A/ANLs before indentation test. (a) Bright field cross-sectional TEM image for the whole sample, inset with the irradiation damage profile and the corresponding SAED pattern. (b) Enlarged cross-sectional TEM image for the less-damaged region indicated by rectangle A in (a). (c) High resolution TEM image for the interfacial structure indicated by the rectangle in (b). (d) The selected region for EDS test, with (d-1) to (d-4) representing the distribution of Zr, Cu, Ni, and Al, respectively.

Fig. 3. The representative cross-sectional high resolution TEM images with focus of (a) -1000 nm and (b) 1000 nm for the irradiated A/ANLs before indentation test.

Fig. 4. Representative load-displacement curves for hardness tests and hardness value of as-deposited and irradiated samples. To avoid overlapping of two curves, the offset was given. (a) Load-displacement curve of ZrCuNiAlSi amorphous alloy before and after irradiation. (b) Load-displacement curve of ZrCu amorphous alloy before and after irradiation. (c) Load-displacement curve of A/ANLs before and after irradiation, inset with the magnified loading curve of the black rectangle. (d) The hardness change in all samples before and after irradiation.

Fig. 5. Load-displacement curve for indentation test and representative TEM images of the as-deposited A/ANLs after indentation. (a) Load-displacement curve, inset with the corresponding SEM image of residual indentation. (b) TEM image of the deformed region below indenter. (c) Magnified image of the region A in (b). (d) Magnified image of the region B in (c). (e) Magnified image of the region C in (c). (f) Magnified image of the region D in (c).

Fig. 6. Load-displacement curve for indentation test and representative TEM images of irradiated A/ANLs after indentation. (a) Load-displacement curve for indentation test, inset with the corresponding SEM image of residual indentation. (b) The right side of residual indentation. (c) The deformed region right underneath the indenter. (d) Magnified image of the region A in (c), inset with the corresponding EDS pattern. (e) and (f) are magnified images of the regions B and C in (d), respectively.

Fig. 7. Representative bright field cross-sectional TEM images of irradiated A/ANLs after indentation at three focus states. (a1, b1, c1) TEM images of the region near surface, i.e., severely deformed region, with focus of -1000 nm, 0 nm and +1000 nm, respectively. (a2, b2, c2) TEM images of the region near the severe deformed region, with focus of -1000 nm, 0 nm and +1000 nm, respectively.

Fig. 8. Schematic description of the deformation mechanism for both the as-deposited and irradiated A/ANLs upon indentation testing. The black ovals, yellow solid circles and red circles represent STZs, stress concentrations and helium bubbles, respectively. The thick arrows indicate mature SBs penetrating distinct constituent layers with the assistance of stress concentrations at the high energy A/A interfaces. The big blue and red dashed circles indicated the area with high and low densities of STZs.