J. Mater. Sci. Technol. ›› 2020, Vol. 52: 218-225.DOI: 10.1016/j.jmst.2020.01.065
• Research Article • Previous Articles Next Articles
A. Shuitceva,*(), D.V. Gunderovb, B. Sunc, L. Lia, R.Z. Valievb,d, Y.X. Tonga,*()
Received:
2019-10-30
Revised:
2020-01-10
Accepted:
2020-01-26
Published:
2020-09-15
Online:
2020-09-18
Contact:
A. Shuitcev,Y.X. Tong
A. Shuitcev, D.V. Gunderov, B. Sun, L. Li, R.Z. Valiev, Y.X. Tong. Nanostructured Ti29.7Ni50.3Hf20 high temperature shape memory alloy processed by high-pressure torsion[J]. J. Mater. Sci. Technol., 2020, 52: 218-225.
Number of revolutions, N | Sample thickness, mm | True strain e | Shear deformation γ | Equivalent shear deformation γeq | |||
---|---|---|---|---|---|---|---|
r | r/2 | r | r/2 | r | r/2 | ||
0.5 | 0.72 | 3.77 | 3.08 | 43.61 | 21.81 | 25.18 | 12.59 |
1 | 0.70 | 4.50 | 3.80 | 89.71 | 44.86 | 51.80 | 25.90 |
3 | 0.52 | 5.89 | 5.20 | 362.31 | 181.15 | 209.18 | 104.6 |
Table 1 Degree of true strain, shear deformation and its equivalent at the edges (r) and at the half-radius (r/2) of Ti29.7Ni50.3Hf20 samples processed by HPT.
Number of revolutions, N | Sample thickness, mm | True strain e | Shear deformation γ | Equivalent shear deformation γeq | |||
---|---|---|---|---|---|---|---|
r | r/2 | r | r/2 | r | r/2 | ||
0.5 | 0.72 | 3.77 | 3.08 | 43.61 | 21.81 | 25.18 | 12.59 |
1 | 0.70 | 4.50 | 3.80 | 89.71 | 44.86 | 51.80 | 25.90 |
3 | 0.52 | 5.89 | 5.20 | 362.31 | 181.15 | 209.18 | 104.6 |
Number of revolutions, N | Microhardness Hv, GPa | ||
---|---|---|---|
center | half radius | edge | |
0a | 3.81 ± 0.05 | ||
0.5 | 5.86 ± 0.10 | 6.38 ± 0.12 | 6.45 ± 0.08 |
1 | 5.79 ± 0.07 | 6.07 ± 0.08 | 6.36 ± 0.07 |
3 | 6.11 ± 0.10 | 6.16 ± 0.10 | 6.29 ± 0.09 |
Table 2 Microhardness of Ti29.7Ni50.3Hf20 samples at initial and deformed states.
Number of revolutions, N | Microhardness Hv, GPa | ||
---|---|---|---|
center | half radius | edge | |
0a | 3.81 ± 0.05 | ||
0.5 | 5.86 ± 0.10 | 6.38 ± 0.12 | 6.45 ± 0.08 |
1 | 5.79 ± 0.07 | 6.07 ± 0.08 | 6.36 ± 0.07 |
3 | 6.11 ± 0.10 | 6.16 ± 0.10 | 6.29 ± 0.09 |
Fig. 2. TEM bright field images of the solution-treated Ti29.7Ni50.3Hf20 alloy showing martensitic variants (a) and inner twins (c) (the SAED pattern (b) was taken from the interface marked by circle in (a).) and microstructure of HPT-processed Ti29.7Ni50.3Hf20 alloy with N = 3 (d). The SAED pattern (e), dark field image (f) and high resolution image (g) were taken from the area of (d). The TEM sample was cut from the near-edge area of HPT-processed specimen.
Fig. 3. TEM bright field image of the band structure in the HPT-processed Ti29.7Ni50.3Hf20 alloy with N = 3. The SAED patterns (b), (c) and (d) were taken from the areas marked by circles in (a). The TEM sample was cut from the near-edge area of HPT-processed specimen.
Fig. 4. DSC curves upon heating of HPT-processed Ti29.7Ni50.3Hf20 alloy with different revolutions numbers (a) and correlation between ΔH and revolution number (b).
Fig. 5. TEM bright field images of HPT-processed Ti29.7Ni50.3Hf20 alloy after isothermal annealing at 500 (a, b), 600 (c, d) and 700 °C (e, f). The SAED patterns were inserted. Parent phase and martensite are marked by “P” and “M”, respectively.
Fig. 6. Histograms of the grain size distributions of parent phase and martensite in Ti29.7Ni50.3Hf20 alloy after annealing at 500 (a), 600 (b) and 700 °C (c).
Fig. 7. TEM bright field (a,b), high resolution TEM (c) image and FFT pattern (d) obtained from the HPT-processed Ti29.7Ni50.3Hf20 alloy annealed at 500 °C. The FFT pattern (d) was taken from area marked by square in (c).
Fig. 8. Hall-Petch relationship showing the measured microhardness of Ti29.7Ni50.3Hf20 alloy after HPT with subsequent annealing as a function of the inverse square-root of grain size.
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