J. Mater. Sci. Technol. ›› 2021, Vol. 64: 1-9.DOI: 10.1016/j.jmst.2020.01.019
• Research Article • Next Articles
Rajendra Kurapatia, Vincent Mauricea,*(), Antoine Seyeuxa, Lorena H. Kleina, Dimitri Merciera, Grégory Chauveaub, Catherine Grèzes-Bessetb, Loïc Berthodc, Philippe Marcusa
Received:
2019-07-22
Revised:
2019-09-17
Accepted:
2019-09-25
Published:
2021-02-20
Online:
2021-03-15
Contact:
Vincent Maurice
About author:
* E-mail address: vincent.maurice@chimieparistech.psl.eu ( V. Maurice).Rajendra Kurapati, Vincent Maurice, Antoine Seyeux, Lorena H. Klein, Dimitri Mercier, Grégory Chauveau, Catherine Grèzes-Besset, Loïc Berthod, Philippe Marcus. Advanced protection against environmental degradation of silver mirror stacks for space application[J]. J. Mater. Sci. Technol., 2021, 64: 1-9.
Fig. 1. Optical images of multilayer stacks SiO2/Ag/SiOx ((a) 0 h; (b) 96 h, in the center; (c) 96 h, at the edge)) and SiO2/Ag/AlOx ((d) 0 h; (e) 96 h, in the center; (f) 96 h, at the edge)) before (0 h) and after (96 h) dry accelerated aging in H2S gas at 1000 mbar and 75 °C.
Fig. 2. (Color online) ToF-SIMS chemical maps (100 μm × 100 μm) of selected negative secondary ions for multilayer stacks SiC CVD/Ag/SiOx (a) and SiC CVD/Ag/AlOx (b) after 96 h of dry accelerated aging in H2S gas at 1000 mbar and 75 °C. The images are recorded in the sample center region, away from the edges.
Fig. 3. ToF-SIMS elemental depth profiles of selected negative secondary ions for multilayer stacks SiO2/Ag/SiOx (a) and SiO2/Ag/AlOx (b) after 96 h of dry accelerated aging in H2S gas at 1000 mbar and 75 °C. The profiles were recorded in the sample center region, away from the edges. The protection layer, silver (Ag) layer and substrate regions are marked, as well as the interfacial Ia and Ib regions.
Fig. 4. Optical images of multilayer stacks SiC CVD/Ag/SiOx ((a) 0 h; (b) 96 h, in the center; (c) 96 h, at the edge) and SiC CVD/Ag/AlOx ((d) 0 h; (e) 96 h, in the center; (f) 96 h, at the edge) before (0 h) and after (96 h) dry accelerated aging in H2S gas at 1000 mbar and 75 °C.
Fig. 5. ToF-SIMS chemical maps (100 μm × 100 μm) of selected negative secondary ions for multilayer stacks SiC CVD/Ag/SiOx (a) and SiC CVD/Ag/AlOx (b) after 96 h of dry accelerated aging in H2S gas at 1000 mbar and 75 °C. The images are recorded near the sample center region, away from the edges.
Fig. 6. ToF-SIMS elemental depth profiles of selected negative secondary ions for multilayer stacks SiO2/Ag/SiOx (a) and SiO2/Ag/AlOx (b) after 96 h of dry accelerated aging in H2S gas at 1000 mbar and 75 °C. The profiles are recorded near the sample center region, away from the edges. The protection layer, silver (Ag) layer and substrate regions are marked, as well as the interfacial Ia and Ib regions.
Fig. 7. Optical images of multilayer stacks SiC CVD/Ag/SiOx (a) and SiC CVD/Ag/AlOx (b) before (0 h) and after (2,4, 6 and 8 h) wet accelerated aging in 1 mM Na2S aqueous solution at pH 13 ((a) all rows and (b) first row) and pH 7 ((b) the second to last row). Center and right column images are recorded in two different sample locations.
Fig. 8. Specular reflectance spectra for stacks SiC CVD/Ag/SiOx (a) and SiC CVD/Ag/AlOx (b) before and after wet accelerated aging in 1 mM Na2S aqueous solution at pH 13 (a) and pH 7 (b).
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