Electron force-induced dislocations annihilation and regeneration of a superalloy through electrical in-situ transmission electron microscopy observations

doi:10.1016/j.jmst.2019.08.008

J. Mater. Sci. Technol. ›› 2020, Vol. 36: 79-83.DOI: 10.1016/j.jmst.2019.08.008

• Research Article • Previous Articles Next Articles

Electron force-induced dislocations annihilation and regeneration of a superalloy through electrical in-situ transmission electron microscopy observations

Xin Zhang^a^b, Hongwei Li^a^b^*(), Mei Zhan^a^b, Zebang Zheng^a^b, Jia Gao^a^b, Guangda Shao^a^b

a State Key Laboratory of Solidification Processing, School of Materials Science and Engineering, Northwestern Polytechnical University, Xi’an 710072, China
b Shaanxi Key Laboratory of High-Performance Precision Forming Technology and Equipment, Northwestern Polytechnical University, Xi’an 710072, China

Received:2019-04-30 Revised:2019-06-19 Accepted:2019-07-12 Published:2020-01-01 Online:2020-02-11
Contact: Li Hongwei

Abstract

Abstract:

What effect does electric current do on dislocation evolution of metals keeps being a confusing question to be answered and proved. To this end, the dislocation evolution of a superalloy with electric current was directly observed by electrical in-situ transmission electron microscopy in this work. Dislocations annihilation at first and then regeneration was found for the first time, which directly proves the existence of electron force during the electrically-assisted manufacturing. Dislocations regeneration would be driven by the electron force and the resistance softening by the local Joule heating effect. Resultantly, a base could be provided for future electrically-assisted research.

Key words: Electron force, Electrical in-situ TEM, Local Joule heating effect, Dislocation structure evolution

Xin Zhang, Hongwei Li, Mei Zhan, Zebang Zheng, Jia Gao, Guangda Shao. Electron force-induced dislocations annihilation and regeneration of a superalloy through electrical in-situ transmission electron microscopy observations[J]. J. Mater. Sci. Technol., 2020, 36: 79-83.

Figures/Tables 4

Fig. 1. The steps of electrical in-situ TEM sample preparation: (a) the sample, (b) FIB process, (c) extracting foil by micromanipulator, (d) transferring foil to the E-chip, (e, f) the final experimental condition.

Fig. 2. Resistance evolution of the sample with the corresponding dislocation structures with the electric current applied time: (a-d) the TEM images showing the evolution of dislocations captured from the electrical in-situ TEM experiment (Suppl. Vid. 1); (e) the diffraction spot of the observed plane.

Fig. 3. TEM images showing the evolution of dislocations captured from the heating in-situ TEM experiment (Suppl. Vid. 2): (a) 0 s, (b) 203 s, (c) 260 s.

Fig. 4. (a) The relationship between the current direction and all lattice planes; (b) Schmidt factor under this electron force direction in each slip system; (c) the dislocation behaviour in (110) plane with the time.

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Electron force-induced dislocations annihilation and regeneration of a superalloy through electrical in-situ transmission electron microscopy observations

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