J. Mater. Sci. Technol. ›› 2020, Vol. 36: 134-139.DOI: 10.1016/j.jmst.2019.07.022
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Heng Chenab, Huimin Xiangb, Fu-Zhi Daib, Jiachen Liua, Yanchun Zhoub*()
Received:
2019-04-26
Published:
2020-01-01
Online:
2020-02-11
Contact:
Zhou Yanchun
Heng Chen, Huimin Xiang, Fu-Zhi Dai, Jiachen Liu, Yanchun Zhou. High entropy (Yb0.25Y0.25Lu0.25Er0.25)2SiO5 with strong anisotropy in thermal expansion[J]. J. Mater. Sci. Technol., 2020, 36: 134-139.
Fig. 2. X-ray diffraction (XRD) pattern of as-prepared HE (Yb0.25Y0.25Lu0.25Er0.25)2SiO5 together with simulated XRD patterns of Yb2SiO5, Y2SiO5, Lu2SiO5 and Er2SiO5.
Materials | Space group | Unit cell parameters | Theoretical density (g/cm3) | |||
---|---|---|---|---|---|---|
a (Å) | b (Å) | c (Å) | β (degree) | |||
(Yb0.25Y0.25Lu0.25Er0.25)2SiO5 | C2/c | 14.3109(6) | 6.6773(7) | 10.3363(8) | 122.180(7) | 7.22 |
Yb2SiO5 | 14.37 | 6.693 | 10.34 | 122.78 | 7.30 | |
Y2SiO5 | 14.3797 | 6.7180 | 10.4077 | 122.19 | 4.29 | |
Lu2SiO5 | 14.2774(7) | 6.6398(4) | 10.2465(6) | 122.224(1) | 7.4 | |
Er2SiO5 | 14.366(2) | 6.6976(6) | 10.3633(1) | 122.219(1) | 6.97 |
Table 1 Unit cell parameters of HE (Yb0.25Y0.25Lu0.25Er0.25)2SiO5 calculated from the XRD pattern and the theoretical densities of HE (Yb0.25Y0.25Lu0.25Er0.25)2SiO5 together with Yb2SiO5 [35], Y2SiO5 [36], Lu2SiO5 [37] and Er2SiO5 [38].
Materials | Space group | Unit cell parameters | Theoretical density (g/cm3) | |||
---|---|---|---|---|---|---|
a (Å) | b (Å) | c (Å) | β (degree) | |||
(Yb0.25Y0.25Lu0.25Er0.25)2SiO5 | C2/c | 14.3109(6) | 6.6773(7) | 10.3363(8) | 122.180(7) | 7.22 |
Yb2SiO5 | 14.37 | 6.693 | 10.34 | 122.78 | 7.30 | |
Y2SiO5 | 14.3797 | 6.7180 | 10.4077 | 122.19 | 4.29 | |
Lu2SiO5 | 14.2774(7) | 6.6398(4) | 10.2465(6) | 122.224(1) | 7.4 | |
Er2SiO5 | 14.366(2) | 6.6976(6) | 10.3633(1) | 122.219(1) | 6.97 |
Fig. 3. (a) Surface SEM image of as-prepared HE (Yb0.25Y0.25Lu0.25Er0.25)2SiO5, (b)?(e) Corresponding EDS mappings of Yb, Y, Lu and Er elements, (f) Grain size distribution of as-prepared HE (Yb0.25Y0.25Lu0.25Er0.25)2SiO5 ceramic.
Fig. 4. (a) High-temperature XRD patterns of HE (Yb0.25Y0.25Lu0.25Er0.25)2SiO5 in the temperature range of 298-1473 K, (b) Variation of normalized cell dimensions (a, b, c, β and V) versus temperature.
Phase | Normalized unit cell dimension | A | B×10-6 | C×10-9 | R2 |
---|---|---|---|---|---|
(Yb0.25Y0.25Lu0.25Er0.25)2SiO5 | a/a298K | 1.0005 | 2.9022 | -0.1681 | 0.9653 |
b/b298K | 1.0004 | 7.4645 | 0.5550 | 0.9966 | |
c/c298K | 1.0000 | 8.6640 | 1.0249 | 0.9998 | |
β/β298K | 1.0000 | -1.5659 | -0.1097 | 0.9999 | |
V/V298K | 1.0013 | 22.6504 | 0.7207 | 0.9958 |
Table 2 Least-squares fitting results of the normalized cell dimensions for HE (Yb0.25Y0.25Lu0.25Er0.25)2SiO5.
Phase | Normalized unit cell dimension | A | B×10-6 | C×10-9 | R2 |
---|---|---|---|---|---|
(Yb0.25Y0.25Lu0.25Er0.25)2SiO5 | a/a298K | 1.0005 | 2.9022 | -0.1681 | 0.9653 |
b/b298K | 1.0004 | 7.4645 | 0.5550 | 0.9966 | |
c/c298K | 1.0000 | 8.6640 | 1.0249 | 0.9998 | |
β/β298K | 1.0000 | -1.5659 | -0.1097 | 0.9999 | |
V/V298K | 1.0013 | 22.6504 | 0.7207 | 0.9958 |
Fig. 6. Schematic illustration of controlling preferred orientation if HE (Yb0.25Y0.25Lu0.25Er0.25)2SiO5 is used as a ceramic top-coat of (a) TBC on a metal substrate and (b) EBC on SiCf/SiCm substrate.
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