[1] Y. Moelo, E. Makovicky, N.N. Mozgova, J.L. Jambor, N. Cook,A. Pring, W. Paar, E.H. Nickel, S. Graeser, S. Karup-Moller,T. Balic-Zunic, W.G. Mumme, F. Vurro, D. Topa, L. Bindi,K. Bente, M. Shimizu, Eur. J. Mineral. 20 (2008) 7-46. [2] G.N. Kryukova, M. Heuer, G. Wagner, T. Doering, K. Bente, J. Sol.Chem. 178 (2005) 376-381. [3] P.P.K. Smith, J. Solid State Chem. 58 (1985) 78-86. [4] K. Hoang, S.D. Mahanti, J. Androulakis, M.G. Kanatzidis, Mater.Res. Soc. Symp. Proc. 886 (2006), 0886eF05-06.1. [5] M.Y. Chen, K.A. Rubin, U.S. Patent, No. 5242784, 1992. [6] M. Hoheisel, H. Dittrich, World Patent, No. 98/28800, 1998. [7] H. Dittrich, German Patent, No. 196 13 683, 1996. [8] H. Dittrich, D.J. Vaughan, R.D.A. Pattrick, S. Graser, E. Makoviky,M. Lux-Steiner, R. Kunst, D. Lincot, in: Proceedings to the 10 th International Conference on Ternary and Multinary Compounds,Stuttgart, Crystal Research and Technology, Berlin, 1996. [9] H. Dittrich, K. Herz, In: Proceeding to the 11th InternationalConference on Ternary and Multinary Compounds, ICTMC-11,Salford, September 8-12, 1997. [10] H. Dittrich, A. Stadler, D. Topa, H.J. Schimper, A. Basch, Phys.Status Solidi A-Appl. Mat. 206 (2009) 1034-1041. [11] S.A. Manolache, A. Duta, L. Isac, M. Nanu, A. Goossens,J. Schoonman, Thin Solid Films 515 (2007) 5957-5960. [12] T. Wagner, M. Krbal, P. Nemec, M. Frumar, Th Wagner, M. Vlcek,V. Perina, A. Mackova, V. Hnatovitz, S.O. Kasap, Appl. Phys. 79(2004) 1563-1565. [13] J. Gutwirth, T. Wagner, P. Nemec, S.O. Kasap, M. Frumar, J. NonCryst. Solids 354 (2008) 497-502. [14] B. Pejova, I. Grozdanov, D. Nesheva, A. Petrova, Chem. Mater. 20(2008) 2551-2565. [15] I. Gaied, A. Gassoumi, M. Kanzari, N. Yacoubi, In: Proceeding to the 10th International Conference on Application of Contemporary Non-Destructive Testing in Engineering, Ljubljana, Slovenia, September 1e3, 2009. [16] A. Gassoumi, M. Kanzari, J. Optoelectron. Adv. Mater. 14 (2012)272-276. [17] N. Ali, S.T. Hussainb, M.A. Iqbala, K. Hutchingc, D. Lane, Optik124 (2013) 4746-4749. [18] P.P.K. Smith, J.B. Parise, Acta Crystallogr. B 41 (1985) 84e87. [19] O.S. Heavens, Optical Properties of Thin Solid Films, Butterworths,London, 1950. [20] A. Gassoumi, M. Kanzari, Med. J. Elec. Commun. 5 (2009) 66-72. [21] X. Hao, J. Ma, D. Zhang, T. Yang, H. Ma, Y. Yang, Ch. Cheng,J. Huang, Appl. Surf. Sci. 183 (2001) 137-142. [22] M.M. El-Nahass, E.M. El-Menyawy, Mater. Sci. Eng. B 177 (2012)145-150. [23] B.D. Cullity, Elements of X-ray Diffraction, Addison-Welsley,London, 1978. [24] G.B. Williamson, R.C. Smallman, Philos. Mag. 1 (1956) 34-45. [25] R. Swanepoel, J. Phys. E-Sci. Instrum. 16 (1983) 1214-1222. [26] A.R. Balu, V.S. Nagarethinama, M.G. Syed Basheer Ahamed,A. Thayumanavan, K.R. Murali, C. Sanjeeviraja, V. Swaminathan,M. Jayachandra, Mater. Sci. Eng. B 171 (2010) 93-98. [27] X. Xiu, Z.Y. Pang, M. Lv, Y. Dai, L. Ye, S. Han, Appl. Surf. Sci.253 (2007) 3345-3348. [28] N. Tigau, V. Ciupina, G. Prpdan, J. Optoelectron. Adv. Mater. 8(2006) 37-42. [29] T.S. Moss, G.J. Burrell, B. Ellis, Semiconductor Opto-Electronics,Wiley, New York, 1973. [30] V.V. Kindyak, V.F. Gremenonok, I.V. Bodnar, V. Rud Yu,G.A. Madvedkin, Thin Solid Films 250 (1994) 33-36. [31] , 1974. [32] E.A. David, N.F. Mott, Philos. Mag. 22 (1970) 903-922. [33] S. Venkatachalam, D. Mangalaraj, S. Narayandass, J. Phys.D-Appl. Phys. 39 (2006) 4777-4782. [34] A. Ubale, Mater. Chem. Phys. 121 (2010) 555e560. [35] S. Sonmezoglu, A. Arslan, T. Serin, N. Serin, Phys. Scr. 84 (2011)065602. [36] M.G. Varnamkhasti, H.R. Fallah, M. Mostajaboddavati,A. Hassanzadeh, Vacuum 86 (2012) 1318-1322. [37] R. Swanepoel, J. Phys. E 16 (1983) 1214e1222. [38] J.C.Manifacier, J. Gasiot, J.P. Fillard, J. Phys. E 9 (1976) 1002-1004. [39] M. Caglar, S. Ilican, Y. Caglar, F. Yakuphanoglu, J. Mater. Sci.-Mater. Electron. 19 (2008) 704-708. [40] K. Prabakar, S.Venkatachalam,Y.L. Jeyachandran, S.K.Narayandass,D. Mangalaraj, Sol. Energy Mater. Sol. Cells 81 (2004) 1-12. |