[1] C. Pacholski, A. Kornowski, H. Weller, Angew. Chem. Int. Ed. 43(2004) 4774-4777.
[2] Z.L. Wang, J. Song, Science 312 (2006) 242-246.
[3] R. Turgeman, S. Tirosh, A. Gedanken, Chem. Eur. J. 10 (2004)1845-1850.
[4] G.R. Gattorno, P.S. Jacinto, L.R. Va’zquez, J. Phys. Chem. B 107(2003) 12597-12604.
[5] E. Meulenkamp, J. Phys. Chem. B 102 (1998) 5566-5572.
[6] L. Spanhel, M.A. Anderson, J. Am. Chem. Soc. 113 (1991) 2826-2833.
[7] E.M. Wong, J.E. Bonevich, P.C. Searson, J. Phys. Chem. B 102(1998) 7770-7775.
[8] Q. Tang, W. Zhou, J. Shen, W. Zhang, L. Kong, Y. Qian, Chem.Commun. (2004) 712-713.
[9] C. Wang, E. Shen, E. Wang, L. Gao, Z. Kang, C. Tian, Mater. Lett.59 (2005) 2867-2871.
[10] Z.R. Tian, J.A. Voigt, J. Liu, B. Mckenzie, M.J. Mcdermott, J. Am.Chem. Soc. 124 (2002) 12954-12955.
[11] C. Wang, E. Wang, E. Shen, L. Gao, Mater. Res. Bull. 41 (2006)2298-2302.
[12] H. Du, F. Yuan, S. Huang, J. Li, Y. Zhu, Chem. Lett. 33 (2004)770-771.
[13] E. Hosono, S. Fujihara, T. Kimura, Electrochem. Solid State Lett. 7(2004) C49-C51.
[14] J. Zhou, N.S. Xu, Z.L. Wang, Adv. Mater. 18 (2006) 2432-2435.
[15] B.L. Zhu, C.S. Xie, D.W. Zeng, W.L. Song, A.H. Wang, Mater.Chem. Phys. 89 (2005) 148-153.
[16] S.W. Kim, T. Kotani, M. Ueda, S. Fujita, S. Fujita, Appl. Phys. Lett.83 (2003) 3593-3595.
[17] S.W. Kim, M. Ueda, M. Funato, S. Fujita, J. Appl. Phys. 97 (2005)104316-104324.
[18] K.K. Kim, N. Koguchi, Y.W. Ok, T.Y. Seong, S.J. Park, Appl. Phys.Lett. 84 (2004) 3810-3812.
[19] J.K. Lee, C.R. Tewell, R.K. Schulze, M. Nastasi, D.W. Hamby, D.A. Lucca, H.S. Jung, K.S. Hong, Appl. Phys. Lett. 86 (2005)183111.
[20] E.W. Seeling, B. Tang, A. Yamilov, H. Cao, R.P.H. Chang, Mater.Chem. Phys. 80 (2003) 257-263.
[21] L. Madler, W.J. Stark, S.E. Pratsinis, J. Appl. Phys. 92 (2002)6537-6540.
[22] B.D. Cullity, Element of X-ray Diffraction, second ed., Addison-Wesley, New York, 1956, p. 99.
[23] J. Tauc, A. Menthe, J. Non-Cryst. Solids 56 (1972) 8-10.
[24] A. Van Dijken, E.A. Meulenkamp, D. Vanmaekelbergh, A. Meijerink,J. Lumin. 90 (2000) 123-128.
[25] Z. Li, Y. Xiong, Y. Xie, J. Inorg. Chem. 42 (2003) 8105-8109.
[26] D. Li, Y.H. Leung, A.B. Djurisic, Z.T. Liu, M.H. Xei, S.L. Shi, S.J.Xu, W.K. Chan, Appl. Phys. Lett. 85 (2004) 1601-1603.
[27] K. Vanheusden,W.L.Warren, C.H. Seager, D.R. Tallant, J.A. Voigt,B.E. Gnade, J. Appl. Phys. 79 (1996) 7983-7990.
[28] M. Liu, A.H. Kitai, P. Mascher, J. Lumin. 54 (1992) 35-42.
[29] X.L. Wu, G.G. Siu, C.L. Fu, H.C. Ong, Appl. Phys. Lett. 78 (2001)2285-2287.
[30] A.I. Ekimov, I.A. Kudryavtsev, M.G. Ivanov, A.L. Efros, J. Lumin.46 (1990) 83-95.
[31] U. Woggon, in: R. Helbig (Ed.), Advances in Solid State Physics,vol. 35, Vieweb, Braunschweig, 1996, p. 145.
[32] U. Woggon, M. Saleh, A. Uhring, M. Portune, C. Klingshrin, J.Cryst. Growth 138 (1994) 988-992. |