J. Mater. Sci. Technol. ›› 2011, Vol. 27 ›› Issue (5): 475-480.

• Modeling and Simulations • 上一篇    

Investigation of orientation relationships between ferrite and cementite in terms of edge-edge matching principle

钟宁1,王晓东2,郭正洪3,戎咏华4   

  1. 1. 上海海事大学材料研究院
    2. shanghai jiaotong university
    3. 上海交通大学材料科学与工程学院
    4. 上海交通大学材料学院
  • 收稿日期:2010-08-12 修回日期:2010-11-25 出版日期:2011-05-28 发布日期:2011-05-28
  • 通讯作者: 郭正洪
  • 基金资助:

    新型高强度淬火分配钢的研究

Orientation Relationships between Ferrite and Cementite by Edge-to-edge Matching Principle

Ning Zhong1), Xiaodong Wang2), Zhenghong Guo2), Yonghua Rong2)   

  1. 1) Institute of Marine Materials Science and Engineering, Shanghai Maritime University, Shanghai 201306, China
    2) School of Materials Science and Engineering, Shanghai Jiao Tong University, Shanghai 200240, China
  • Received:2010-08-12 Revised:2010-11-25 Online:2011-05-28 Published:2011-05-28
  • Contact: Zhenghong Guo
  • Supported by:

    the National Natural Science Foundation of China (Grant Nos. 51001069 and 51031001)

RichHTML

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摘要： The crystallographic features of pearlite were investigated in terms of experiments and edge-to-edge matching principle. Two new orientation relationships between ferrite and cementite were determinated by selected area electron diffraction and then explained by our modified edge-to-edge matching method. The consistence of the experimental results with theoretical prediction confirms the practicability of the modified edge-to-edge matching model.

Abstract: The crystallographic features of pearlite were investigated by experiments and edge-to-edge matching principle. Two new orientation relationships between ferrite and cementite were determinated by selected area electron diffraction and then explained by our modified edge-to-edge matching method. The  consistence of the experimental results with theoretical prediction confirms the practicability of the modified edge-to-edge matching model.

Key words: Orientation relationship, Pearlite, Edge-to-edge matching, Transmission electron microscopy