J. Mater. Sci. Technol. ›› 1997, Vol. 13 ›› Issue (6): 491-494.

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Measurement of Grain Growth in Nanocrystalline Materialsby Means of Differential Scanning Calorimetry

Ke LU and Zhenfu DONG(State Key Lab. for RSA, Institute of Metal Research, Chinese Academy of Sciences, Shenyang 110015, China)   

  • 收稿日期:1997-11-28 修回日期:1997-11-28 出版日期:1997-11-28 发布日期:2009-10-10

Measurement of Grain Growth in Nanocrystalline Materials by Means of Differential Scanning Calorimetry

Ke LU and Zhenfu DONG(State Key Lab. for RSA, Institute of Metal Research, Chinese Academy of Sciences, Shenyang 110015, China)   

  • Received:1997-11-28 Revised:1997-11-28 Online:1997-11-28 Published:2009-10-10

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摘要： 1.IntroductionNanocrystallinematerialsarestructurallycharac-terizedbyultrafinegrainsseparatedbymetastablegrainboundariesorillterphaseboundariesofwhichthevolumefractionismuchenhancedrelativetotheconveationalpolycrystals.Therefore,thermallyacti-vatedgrowthofthenm-sizedcrystallitesattheex-penseofthesurroundingmetastable'boundariesiscrucialtothisnewfamilyofmaterials,andhellcehasdrawnmuchattention....

Abstract: In this work, we demonstrated that the differential scanning calorimetry (DSC) is not always reliable in measuring thermal stability and grain growth process in nanocrystalline materials by a quantitative analysis and comparison of the DSC data measured in nanocrystalline Ni-P and Hf-Ni samples.