J. Mater. Sci. Technol. ›› 2017, Vol. 33 ›› Issue (3): 285-290.
• Orginal Article • Previous Articles Next Articles
Feng Yingab*,J. Trainer Daniela,Peng Hongshangc,Liu Yed,Chen Kea
Received:
2016-08-22
Accepted:
2016-09-29
Online:
2017-03-20
Published:
2017-05-18
Contact:
Feng Ying
Fig. 2. SEM images of electronic devices for graphene electrical property measurements. (a) six-terminal Hall bar; (b) square shape of van der Pauw device; (c) graphene strip for TLM.
Fig. 3. SEM images of a pristine Cu foil (a), a Cu foil after exposing in atmosphere for several weeks (b), a Cu foil pre-cleaned in acetic acid (c), and graphene film on a Cu substrate with 90?min CVD growth (d).
Fig. 4. Representative SEM images of graphene flakes grown on Cu foils when CVD growth time less than around 30?min (a), the H2/CH4 volume ratio greater than 1:2 (b).
Fig. 5. (a) SEM image of continuous graphene film grown on Cu foils; (b) zoomed-in image from (a); (c) SEM image of a Cu foil in topographical imaging mode before any treatments; (d) SEM image of a Cu foil in topographical imaging mode after graphene growth. (b) and (d) are the same places on the sample.
Sample | T (K) | R□ (kΩ) | n□?1012×(cm-2) | μ (cm2/V-1?s-1) |
---|---|---|---|---|
No. 1 (Hall?bar) | 300 | 1.18 | 5.7 | 920 |
No. 2 (van der Pauw) | 300 | 3.59 | 3.7 | 470 |
No. 3 (van der Pauw) | 300 | 1.42 | 5.4 | 820 |
Table 1 Sheet resistivity and charge mobility of graphene[16].
Sample | T (K) | R□ (kΩ) | n□?1012×(cm-2) | μ (cm2/V-1?s-1) |
---|---|---|---|---|
No. 1 (Hall?bar) | 300 | 1.18 | 5.7 | 920 |
No. 2 (van der Pauw) | 300 | 3.59 | 3.7 | 470 |
No. 3 (van der Pauw) | 300 | 1.42 | 5.4 | 820 |
Fig. 7. Resistance obtained for graphene with different lengths by TLM and its liner fitting. The dotted line indicates a linear extrapolation of fitting data to d?=?0 axis.
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